Chip Aging Tester CFT1000
The aging test is a critical evaluation of a chip’s operational stability under extreme temperature conditions. By exposing the chip to prolonged high- or low-temperature environments and monitoring its performance, the Chip Aging Tester CFT1000 effectively assesses the device’s reliability and stability.
- HC
- CHINA
- 1 MONTH
- 3000/MONTH
- Information
The Chip Aging Tester CFT1000 performs comprehensive aging tests by connecting to the device under test (DUT) via high-temperature cables and fixtures. After power-up, the Chip Aging Tester CFT1000 continuously monitors multiple performance parameters of the DUT under extreme temperature conditions, including voltage, current, frequency, temperature, memory read/write, and communication functions, to determine whether the chip meets qualification standards.
The Chip Aging Tester CFT1000 is ideal for burn-in testing of RTC clock chips and other semiconductor devices, supporting up to 480 DUTs in a single test cycle. The Chip Aging Tester CFT1000 can measure critical signals such as voltage, current, frequency, and temperature, with a wide temperature range of -55℃ to 155℃. Communication with the DUT is achieved via I2C, SPI, or RS485 interfaces, while the Chip Aging Tester CFT1000 connects to a host PC through USB/Ethernet. Additionally, the Chip Aging Tester CFT1000 features a built-in dual-channel power supply for flexible test configurations.
User-Friendly Software & Automation
The Chip Aging Tester CFT1000 software supports both manual and automated test modes. In automated mode, users can import test script files to configure parameters automatically. After clicking the "Execute" button, the Chip Aging Tester CFT1000 runs the test sequence in either single-pass or loop mode. All test data and results are automatically logged into a computer-generated report for further analysis.
Test Setup & Operation
The DUT is placed on the test fixture socket, while the fixture and DUT are housed inside a thermal chamber.
The Chip Aging Tester CFT1000 and PC remain outside the chamber, connected via high-temperature cables (for signal/power) and USB (for data communication).
To begin testing:
Plug in the AC power supply and switch on the Chip Aging Tester CFT1000.
Launch the Chip Aging Tester CFT1000 software interface.
Start the test process with a single click.
Key Features Summary
High-throughput testing: Supports 480 DUTs simultaneously.
Wide temperature range: -55℃ to 155℃ for extreme environment simulation.
Multi-interface support: I2C, SPI, RS485 for flexible DUT communication.
Automated reporting: Generates test logs and reports in real time.
The Chip Aging Tester CFT1000 ensures efficient and accurate semiconductor reliability validation, making it an essential tool for IC production and quality assurance.
