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Understanding the distinction between touch trigger and scanning probes is fundamental to optimizing CMM inspection processes. The trigger probe is the reliable, high-speed workhorse for discrete geometric features, while the scanning probe is the master of detailed, continuous surface characterization. Rather than viewing them as competitors, they should be seen as complementary technologies within a comprehensive metrology strategy. By leveraging the strengths of each—through a multi-sensor CMM or a well-planned inspection protocol—manufacturers can achieve both efficiency and profound insight, ensuring part quality from the simplest dimension to the most complex surface form. The right probe choice, driven by application needs, is key to unlocking the full potential of a precision CMM.